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MSV-5000 spektrometry mikroskopowe image

MSV-5000 spektrometry mikroskopowe

The members of the JASCO MSV-5000 microscope spectrometer series are used for examining microscopic samples. Beside their ability of conventional imaging, these microscopes are capable of recording the spectrum of the light passing through the samples or the reflected one, thus providing information on the chemical composition of the sample. In this way the observed spectral range is not limited only to the visible (Vis) spectral range (300-800 nm), but also covers the entire UV-Vis-NIR (200-2700 nm) wavelength range. An important advantage is that a single instrument is able to measure the optical properties of the samples within this broad spectral range. Therefore, the typical field of application of microspectrometers can be e.g. the examination of microscopic forensic and/or biological samples, the color determination of paint fragments, the examination of semiconductors or other optical elements in the spectral range wider than the visible light spectrum. The control of microspectrometers is provided by the Spectra Manager II software package, which controls all the JASCO spectroscopic instruments.

MSV-5100, MSV-5200 and MSV-5300

The MSV-5000 series of microspectrometers are dual beam spectrometers operating with a single monochromator adjusted to a microscope capable of transmittance/reflectance measurements, and equipped with Cassegrain (mirror) lenses working in the wide spectral range of 200-2700 nm. The existence of the reference light path of the spectrometer, provides an excellent photometric stability in the entire spectral range. Through the beam attenuator placed in the reference light path, the sample and the reference beam paths can be equalized, thus the photometric range of measurement can be exploited optimally. The high-performance broadband Czerny-Turner monochromator guarantees excellent spectral resolution and wavelength accuracy in the entire spectral range. The switching between the deuterium (UV) and tungsten-halogen lamps (Vis/NIR) is done automatically. The spectrum scan rate is variable and the step recording mode can also be selected. The MSV-5100 UV-Vis microscope equipped with the photomultiplier (PMT) detector operates in the 200-900 nm range, while the MSV -5200 microscope with the PMT detector and a Peltier-cooled PbS detector is able to measure in a wider range up to 2700 nm. The MSV-5300 model equipped with a PMT detector and an InGaAs detector optimized for the near range NIR up to 1600 nm, is a dedicated NIR microscope. The switching between the detectors is done automatically.

The sample placed on the manually (or optionally automatically) operated microscope sample stage is illuminated by an intensive bright LED light in order to select the measurement point. The image of the sample can be observed through the high-resolution CMOS camera (or through the optional binoculars) and the spectrum recording sites may be selected. 4 lenses can be placed within the objective turret. The transmission/reflection spectrum recording of the selected points of the sample can be done with Cassegrain 10x, 16x or 32x magnifying lenses. The circle of 10 μm diameter is the size of the minimum area, still distinctly measurable (in the spectrum measured with a 16x lens and a 5-nm bandwidth in the UV-Vis spectrum). Polarization measurements are also possible with the Glan-Taylor polarizers configured as standard (the installation of the automatic analyzer is optional).

Specifications:

MSV-5100

    • wavelength range: 200-900 nm
    • light source: deuterium and halogen lamp (optionally Xe lamp)
    • scanning speed: 10 – 4000 nm/min
    • bandwidth: 1, 2, 5 or 10 nm
    • detector: photomultiplier (PMT)
    • wavelength change speed: 8000 nm/min
    • wavelength accuracy: ±0.3 nm (656.1 nm)
    • wavelength repeatability: ±0.05 nm

Microscope

    • manual X-Y-Z sample stage (automated is optional)
    • illumination: LED
    • sample observation: high resolution CMOS camera (1600×1200 pixels) (optionally binocular)
    • transmission and reflection mode
    • 10x, 16x, 32x Cassegrain objectives
    • minimum sampling area: 10 μm diameter circle
    • standard Glan-Taylor polariser (optionally with analysator)
    • easy handle front control panel
  • dimensions: 700(W)x740(D)x640(H) mm, 105 kg
  • control possibilities: with Spectra Manager II PC software

MSV-5200, MSV-5300

    • wavelength range:
      • MSV-5200: 200-2700 nm
      • MSV-5300: 200-1600 nm
    • light source: deuterium and halogene lamp (optionally Xe-lamp)
    • scanning speed: 10 – 4000 nm/min

 UV-VIS specifications:

    • bandwidth: 1, 2, 5 and 10 nm
    • detector: photomultiplier (PMT)
    • wavelength change speed: 8000 nm/min
    • wavelength accuracy: ±0.3 nm (656.1 nm)
    • wavelength repeatibility: ±0.05 nm

NIR specifications:

    • bandwidth: 4, 8, 20, 40 nm
    • detector:
      • MSV-5200: Peltier-cooled PbS detector
      • MSV-5300: Peltier-cooled InGaAs detector
    • wavelength change speed: 32000 nm/min
    • wavelength accuracy: ±1.5 nm
    • wavelength repeatibility: ±0.2 nm

Microscope

    • manual X-Y-Z sample stage (automated is optional)
    • illumination: LED
    • sample observation: high resolution CMOS camera (1600×1200 pixels) (optionally binocular)
    • transmission and reflection mode
    • 10x, 16x, 32x Cassegrain objectives
    • minimum sampling area: 10 μm diameter circle
    • standard Glan-Taylor polariser (optionally with analysator)
    • easy handle front control panel
  • dimensions: 700(W)x740(D)x640(H) mm, 105 kg
  • control possibilities: with Spectra Manager II PC software

Spectra Manager II

The microscope spectrometer controller Spectra Manager II software package includes all the functions that control the instruments (measuring parameters, selecting the measuring area, focus, stage movement, mapping measurements). The visual image and the registered spectrum of the measured surface mediated by the CMOS camera can be displayed side by side. In the analysis section all the mathematical functions necessary for the spectra evaluation and processing can be found, adding the functions necessary for processing the measurement results obtained during the mapping measurements. The calculation of the film thickness and color analysis are parts of the basic software.

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